Designed for use in bioscience research, this new atomic-force microscopy (AFM) system has AFM fluid imaging technique at its core. With extremely low tip-sample interactions, samples are never damaged. It is available with the AFM head and high bandwidth, low-noise control electronics. Manufacturer says the system is extremely stable to drift and has the ability to detect the smallest cantilever deflections, enabling the production of stunning images.
The system is designed to provide high AFM performance in liquids and air, integrated with optical microscopy. It comes with good physical and optical access to the sample from front and side, even when head and condenser are in place. The tip-scanning head equipped with a flexure scanner gives high flexibility for a large variety of different samples.
JPK Instruments
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