Incorporating a number of advancements, including newly designed and simplified software and an improved footprint, the Supermini200 wavelength dispersive X-ray fluorescence (WDXRF) spectrometer is designed to offer performance and value in a compact package. Elemental analysis is among the most important fundamental measurements made for industrial quality control and research and development. Wavelength dispersive X-ray fluorescence is one of the most powerful and well established nondestructive techniques for elemental analysis. It has numerous advantages, including light element sensitivity, exceptional elemental resolving power, and low limits of detection. This system combines all of the advantages of traditional WDXRF elemental analysis systems in a size that is 25% that of traditional WDXRF units.
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