Increasing STEM resolution to 63 picometers, the new JEOL JEM-ARM300F transmission electron microscope (TEM) pushes atomic resolution boundaries.
Designed to meet the most advanced materials development requirements for atom-by-atom characterization and chemical mapping, the system, nicknamed the Grand ARM, offers the highest level of performance in JEOL’s line of atomic resolution microscopes.
Extreme resolution of 63pm is achieved in STEM mode at an accelerating voltage of 300kV. The new system supports accelerating voltage levels of 300kV and 80kV as standard. JEOL-proprietary spherical aberration correctors are integrated in the image-forming system and illumination system, and automatically controlled using the JEOL COSMO corrector system module.
An ultra-stable cold-cathode field emission electron gun features a high brightness beam with minimum chromatic aberration. A complete line of signal detectors are available, including EDS up to 100mm2 and EELS, backscattered electron detectors, and up to 4 STEM detectors. The TEM also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image, and bright field image.
The system can be configured for ultrahigh resolution imaging or analytical applications for high sensitivity and in situ analysis according to the user’s needs.
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