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Measure surface topography of large samples

Available as an integrated option for the WITec alpha300 microscope series, the TrueSurface microscopy enables topographic Raman imaging on large samples. The new imaging mode is also available as an upgrade for installed alpha300 and alpha500 systems. The functional core of the measurement mode is the sensor for optical profilometry, now fixed in the microscope objective turret. The system measures the surface topography of large samples and correlates it with confocal Raman microscopy. This allows very rough or heavily inclined samples to be chemically characterized precisely, automatically and easily while also being confocally imaged.


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