Ottawa, ON May 27, 2003 The National Research Council’s Institute for Microstructural Sciences (NRC-IMS) and microanalytical services provider MuAnalysis have announced the beginning of a research agreement to develop methods to detect semiconductor anomalies using a new technique known as dynamic electroluminescence imaging (DEI). The goal of this collaboration is to develop commercial, practical applications of this technology to pinpoint minute errors in today’s complex semiconductor devices.
DEI is a technique in semiconductor analysis that allows scientists to capture and analyse images from microscopic electronic devices while they are operating. NRC-IMS has recently developed an instrument to perform DEI, currently the only one of its kind in Canada. The instrument has been installed at MuAnalysis headquarters in Ottawa.